DC25_PAPER_Track02_FastBERAnalysisTechniquefor_Pang.pdf

1、 Fast BER Analysis Technique for Next Generation Chiplet Simultaneous Bi-Directional Transceiver Tingting.pang,T-Head Semiconductor Co.,Ltd.Yanbin.chen,T-Head Semiconductor Co.,Ltd.Jialong.dong,Julin Technology Co.,Ltd Abstract For the explosively increasing demand for higher bandwidth in Chiplet ap

2、plication,Single-ended simultaneous bidirectional(SBD)signaling is attractive since it doubles the date rate per pin.To achieve the ultra-low bit error rate(BER)design target for SBD transceiver,a fast,accurate and efficient simulation technique is needed.Therefore,this paper proposes a novel statis

3、tical modeling methodology based on double-edge response(DER),and captures the generation of self-interference which is the key for SBD signaling modeling.These will involve asymmetric rising and falling edges,nonlinear filtering effects,and uncertain phase relationship between the outbound TX signa

4、l and near-end inbound received RX signal.The accuracy of the proposed method is validated with spice simulation for a high-speed SBD link.Key words:simultaneous bidirectional,self-interference,statistical simulation Author(s)Biography Tingting Pang,a senior signal integrity engineer at T-Head Semic

5、onductor Co.,Ltd.She is working on DDR/D2D modeling,simulation and validation.Her areas of interest are system-level signal/power integrity and high-speed transceiver design.Yanbin Chen,a signal integrity engineering manager at T-Head Semiconductor Co.,Ltd.,responsible for advanced package design,DD

6、R/D2D system performance development,and simulation methodology/validation.He received his B.S.and M.S.from East China Normal University,in 2005,2008 respectively.Jialong Dong,graduated from the university of science and technology of China,Hefei,China.He joined Julin Technology Co.,Ltd as a signal